The talk was given at a Seminar hold by a partner company, IDEC Corporation. The instrument is simple yet capable to visualize (not observe) nano-scale particles. The semiconductor-laser beam is compressed by refraction to a low profile, intense illumination region in which nanoparticles present in the liquid film. The nanoparticles as small as 10nm scatter laser light by the Rayleigh scattering and can be visualized via a conventional microscope and the image is captured by a video camera. Dr. Carr and some PhDs started the SME in 2003 and wined Queen's Award for Enterprise for International Trade this year. Now more than 400 scientific/technological papers cite the instrument for use of nanoparticle characterization.